QJ 1551A-1998 军用微型计算机筛选技术条件
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基本信息
标准名称: | 军用微型计算机筛选技术条件 |
中标分类: | 航空、航天 >> 航空、航天综合 >> 电子计算机应用 |
ICS分类: | 航空器和航天器工程 >> 航天系统和操作装置 |
替代情况: | QJ 1551-88 |
发布日期: | 1998-08-05 |
实施日期: | 1998-12-01 |
首发日期: | |
作废日期: | |
出版日期: | |
页数: | 10页 |
适用范围
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前言
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目录
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引用标准
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所属分类: 航空 航天 航空 航天综合 电子计算机应用 航空器和航天器工程 航天系统和操作装置
下载地址: 点击此处下载
【英文标准名称】:StandardPracticeforNeutronRadiationDamageSimulationbyCharged-ParticleIrradiation
【原文标准名称】:用带电粒子照射法模拟中子辐射损害的标准实施规程
【标准号】:ASTME521-1996(2009)
【标准状态】:现行
【国别】:美国
【发布日期】:1996
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.08
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:
【英文主题词】:accelerators;beamheating;chargedparticleirradiation;damagecalculations;dosimetry;transmissionelectronmicroscopy;ionirradiation;metallography;microstructure;radiationdamagecorrelation;radiationdamagesimulation;voidswelling
【摘要】:Acharacteristicadvantageofcharged-particleirradiationexperimentsisprecise,individual,controlovermostoftheimportantirradiationconditionssuchasdose,doserate,temperature,andquantityofgasespresent.Additionalattributesarethelackofinducedradioactivationofspecimensand,ingeneral,asubstantialcompressionofirradiationtime,fromyearstohours,toachievecomparabledamageasmeasuredindisplacementsperatom(dpa).Animportantapplicationofsuchexperimentsistheinvestigationofradiationeffectsinnot-yet-existingenvironments,suchasfusionreactors.Theprimaryshortcomingofionbombardmentsstemsfromthedamagerate,ortemperaturedependencesofthemicrostructuralevolutionaryprocessesincomplexalloys,orboth.Itcannotbeassumedthatthetimescalefordamageevolutioncanbecomparablycompressedforallprocessesbyincreasingthedisplacementrate,evenwithacorrespondingshiftinirradiationtemperature.Inaddition,theconfinementofdamageproductiontoathinlayerjust(often8764;1x03BC;m)belowtheirradiatedsurfacecanpresentsubstantialcomplications.Itmustbeemphasized,therefore,thattheseexperimentsandthispracticeareintendedforresearchpurposesandnotforthecertificationorthequalificationofequipment.Thispracticerelatestothegenerationofirradiation-inducedchangesinthemicrostructureofmetalsandalloysusingchargedparticles.TheinvestigationofmechanicalbehaviorusingchargedparticlesiscoveredinPracticeE821.1.1Thispracticeprovidesguidanceonperformingcharged-particleirradiationsofmetalsandalloys.Itisgenerallyconfinedtostudiesofmicrostructuralandmicrochemicalchangescarriedoutwithionsoflow-penetratingpowerthatcometorestinthespecimen.Densitychangescanbemeasureddirectlyandchangesinotherpropertiescanbeinferred.Thisinformationcanbeusedtoestimatesimilarchangesthatwouldresultfromneutronirradiation.Moregenerally,thisinformationisofvalueindeducingthefundamentalmechanismsofradiationdamageforawiderangeofmaterialsandirradiationconditions.1.2Thewordsimulationisusedhereinabroadsensetoimplyanapproximationoftherelevantneutronirradiationenvironment.Thedegreeofconformitycanrangefrompoortonearlyexact.Theintentistoproduceacorrespondencebetweenoneormoreaspectsoftheneutronandchargedparticleirradiationssuchthatfundamentalrelationshipsareestablishedbetweenirradiationormaterialparametersandthematerialresponse.1.3Thepracticeappearsasfollows:
Section
Apparatus
4
SpecimenPreparation
5-10
IrradiationTechniques(includingHeliumInjection)
11x2013;12
DamageCalculations
13
PostirradiationExamination
14-16
ReportingofResults
17
CorrelationandInterpretation
18-22
【英文标准名称】:Mechanicalstandardizationofsemiconductordevices-Part6-1:Generalrulesforthepreparationofoutlinedrawingsofsurfacemountedsemiconductordevicepackages;Designguideforgull-wingleadterminals
【原文标准名称】:半导体器件的机械标准化第6-1部分:表面安装半导体器件封装外形图绘制的一般规则鸥翼引出线端的设计指南
【标准号】:IEC60191-6-1-2001
【标准状态】:现行
【国别】:国际
【发布日期】:2001-10
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47D
【标准类型】:()
【标准水平】:()
【中文主题词】:尺寸;定义;作标记;半导体器件;电子设备及元件;半导体;电气外壳;电气工程;外壳;电子工程;集成电路
【英文主题词】:Casedrawing;Definitions;Design;Dimensions;Drawings;Electricenclosures;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Enclosures;Engineeringdrawings;Illustrations;Integratedcircuits;Marking;Mechanic;Semiconductordevices;Semiconductorpackage;Semiconductors;Standardization
【摘要】:ThispartofIEC60191coverstherequirementsforthedesignruleofterminalshapeplasticpackageswithgull-wingleads;e.g.,QFP,SOP,SSOP,TSOP,etc.whicharepackagesclassifiedasFormEinIEC60191-4.Thispublicationisintendedtoestablishcommonrulesonterminalshapesirrespectiveofpackagetypes.note:1)IEC60191-4:199,Mechanicalstandardizationofsemiconductordevices-Part4:Codingsystemandclassificationintoformsofpackageoutlinesforsemiconductordevicepackages.
【中国标准分类号】:L04;L40
【国际标准分类号】:01_100_25;31_240
【页数】:7P.;A4
【正文语种】:英语
【原文标准名称】:用带电粒子照射法模拟中子辐射损害的标准实施规程
【标准号】:ASTME521-1996(2009)
【标准状态】:现行
【国别】:美国
【发布日期】:1996
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.08
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:
【英文主题词】:accelerators;beamheating;chargedparticleirradiation;damagecalculations;dosimetry;transmissionelectronmicroscopy;ionirradiation;metallography;microstructure;radiationdamagecorrelation;radiationdamagesimulation;voidswelling
【摘要】:Acharacteristicadvantageofcharged-particleirradiationexperimentsisprecise,individual,controlovermostoftheimportantirradiationconditionssuchasdose,doserate,temperature,andquantityofgasespresent.Additionalattributesarethelackofinducedradioactivationofspecimensand,ingeneral,asubstantialcompressionofirradiationtime,fromyearstohours,toachievecomparabledamageasmeasuredindisplacementsperatom(dpa).Animportantapplicationofsuchexperimentsistheinvestigationofradiationeffectsinnot-yet-existingenvironments,suchasfusionreactors.Theprimaryshortcomingofionbombardmentsstemsfromthedamagerate,ortemperaturedependencesofthemicrostructuralevolutionaryprocessesincomplexalloys,orboth.Itcannotbeassumedthatthetimescalefordamageevolutioncanbecomparablycompressedforallprocessesbyincreasingthedisplacementrate,evenwithacorrespondingshiftinirradiationtemperature.Inaddition,theconfinementofdamageproductiontoathinlayerjust(often8764;1x03BC;m)belowtheirradiatedsurfacecanpresentsubstantialcomplications.Itmustbeemphasized,therefore,thattheseexperimentsandthispracticeareintendedforresearchpurposesandnotforthecertificationorthequalificationofequipment.Thispracticerelatestothegenerationofirradiation-inducedchangesinthemicrostructureofmetalsandalloysusingchargedparticles.TheinvestigationofmechanicalbehaviorusingchargedparticlesiscoveredinPracticeE821.1.1Thispracticeprovidesguidanceonperformingcharged-particleirradiationsofmetalsandalloys.Itisgenerallyconfinedtostudiesofmicrostructuralandmicrochemicalchangescarriedoutwithionsoflow-penetratingpowerthatcometorestinthespecimen.Densitychangescanbemeasureddirectlyandchangesinotherpropertiescanbeinferred.Thisinformationcanbeusedtoestimatesimilarchangesthatwouldresultfromneutronirradiation.Moregenerally,thisinformationisofvalueindeducingthefundamentalmechanismsofradiationdamageforawiderangeofmaterialsandirradiationconditions.1.2Thewordsimulationisusedhereinabroadsensetoimplyanapproximationoftherelevantneutronirradiationenvironment.Thedegreeofconformitycanrangefrompoortonearlyexact.Theintentistoproduceacorrespondencebetweenoneormoreaspectsoftheneutronandchargedparticleirradiationssuchthatfundamentalrelationshipsareestablishedbetweenirradiationormaterialparametersandthematerialresponse.1.3Thepracticeappearsasfollows:
Section
Apparatus
4
SpecimenPreparation
5-10
IrradiationTechniques(includingHeliumInjection)
11x2013;12
DamageCalculations
13
PostirradiationExamination
14-16
ReportingofResults
17
CorrelationandInterpretation
18-22
【英文标准名称】:Mechanicalstandardizationofsemiconductordevices-Part6-1:Generalrulesforthepreparationofoutlinedrawingsofsurfacemountedsemiconductordevicepackages;Designguideforgull-wingleadterminals
【原文标准名称】:半导体器件的机械标准化第6-1部分:表面安装半导体器件封装外形图绘制的一般规则鸥翼引出线端的设计指南
【标准号】:IEC60191-6-1-2001
【标准状态】:现行
【国别】:国际
【发布日期】:2001-10
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47D
【标准类型】:()
【标准水平】:()
【中文主题词】:尺寸;定义;作标记;半导体器件;电子设备及元件;半导体;电气外壳;电气工程;外壳;电子工程;集成电路
【英文主题词】:Casedrawing;Definitions;Design;Dimensions;Drawings;Electricenclosures;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Enclosures;Engineeringdrawings;Illustrations;Integratedcircuits;Marking;Mechanic;Semiconductordevices;Semiconductorpackage;Semiconductors;Standardization
【摘要】:ThispartofIEC60191coverstherequirementsforthedesignruleofterminalshapeplasticpackageswithgull-wingleads;e.g.,QFP,SOP,SSOP,TSOP,etc.whicharepackagesclassifiedasFormEinIEC60191-4.Thispublicationisintendedtoestablishcommonrulesonterminalshapesirrespectiveofpackagetypes.note:1)IEC60191-4:199,Mechanicalstandardizationofsemiconductordevices-Part4:Codingsystemandclassificationintoformsofpackageoutlinesforsemiconductordevicepackages.
【中国标准分类号】:L04;L40
【国际标准分类号】:01_100_25;31_240
【页数】:7P.;A4
【正文语种】:英语